Test Systems
group of interoperable devices whose integration perform a common test purpose.
See Also: Systems, Equipment, System Integrators, System Test, System Integration
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Motor/Generator Test Equipment
Winding ohmmeters RMO-M series measure winding resistance of inductive test objects such as electrical motors and generators. Motor test or generator test of winding resistance is especially important for early-stage failure detection.RMO-M series instruments generate true DC ripple-free current with automatically regulated measurement and discharge process. Even more, test instruments are portable and enclosed in a metal casing.Applications supported by DV Power motor/generator test equipment i...show more -
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Distributed Simulation & Test Environment
Modular hardware and software architecture with multipurpose modules and components in a common and reconfigurable simulation and test environment easily adaptable to meet project‐ and customer‐specific requirements.
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Test Contactor/Probe Head
cBoa
cBoa™ test contactors and probe heads are the solutions for contacting high-frequency devices for package test or final test at wafer. The robust design and materials of the cBoa probe withstand the rigors of high-volume test by providing longer life and higher yield. The homogeneous DUT side plunger provides longer run times between cleaning and increased probe life.The cBoa features a stainless-steel spring for tri-temp testing and performs in operating temperatures of -55°C to +155°C and bandwidth of up to 35 GHz @ -1 dB.
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Oil Resistivity & Tan Delta Test Set-Up
This testing set is an automated instrument, widely used for measuring electrical characteristics of insulating liquids, transformer oil and other insulating material samples.
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Environmental Monitoring Systems
Sensaphone Family
Comprehensive line of remote monitoring products that safeguard valuable assets by tracking critical environmental data such as temperature, humidity and power failures. Sensaphone products provide alerts and proactive monitoring data to homeowners and facility managers in many areas including telecommunications, oil and gas, water and wastewater, HVACR, agriculture, healthcare, data centers and greenhouses.
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Conformance Calibration Standard Test Card for ISO/IEC Data Matrix and GS1 DataMatrix Symbol Verifiers
AI-CCS-DM-G Rev A
This precision 2D barcode Conformance Calibration Standard Test Card is the first 2D test card to provide ALL 12 of the Primary Reference Symbols specified by ISO 15426-2 for barcode verifiers. They are sized from 0.5mm to 0.2mm so that all the symbol sizes specified in Annex A.3.1 can be tested. Symbols 1-4 are GS1 DataMatrix symbols, while symbols 5-12 are ISO/IEC Data Matrix symbols consistent with the ISO/IEC 16022 standard. The card also includes four calibrated reflectance patches.
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Test Leads
An IT professional who oversees the process of testing software before moving it to production.
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Stackable Single Slot Test Fixture
Stackable Single Slot Test Fixture: Testing, Development, and Validation. The VITA 48.2-compliant Single Slot Test Fixture can be used for development, validation, and environmental testing. It is available in VPX, VME, CompactPCI, or custom form factors and can be vertically or horizontally mounted.
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High Speed Camera System
MEMRECAM HX-3e
nac’s MEMRECAM HX-3e o ers an astounding 5 megael resolution at up to 2,000 fps, Full HD resolution at up to 4,670 fps, 1 Mega Pixel resolution at up to 9,220 fps, and so much more! The HX-3e gives the user the best possible solutions: the highest resolutions available; the highestlight sensitivity available; and ultra fast imaging.
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Thin-Film Thickness Measurement Systems
The Filmetrics® range of affordable reflectometers deliver high-precision thin-film thickness measurements in seconds. These easy-to-use tools, combined with intelligent software and a broad range of accessories and configurations, provide maximum versatility in film thickness measurements ranging from 1nm to 3mm.
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Fanless Embedded System With Socket G2 Intel® Core™ I7/i5/i3 & Celeron® Processor And 4 GbE LANs
eBOX660-872-FL
A high-performance fanless embedded system with 3rd Generation Intel® Core™ processor (Ivy Bridge), the eBOX660-872-FL, is presented by Axiomtek earnestly. It incorporates the 3rd Generation Intel® Core™ processor (i7/ i5/ i3) or Intel® Celeron® processor with Intel® HM76 Express chipset, propelling computing with better processing. With the great graphics computing capability and dual view support, this fanless embedded box computer is especially suited for automatic optical inspection, digital...show more -
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Frequency Converter Test Solution Up To 50 GHz
N5245BP
The N5245BP provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for frequency converter test up to 50 GHz. This bundle product
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Test Kit
Metriso B530
Wolfgang Warmbier GmbH & Co. KG
Test voltage / Test current: 1 mA < I < 1,3 mAHigh ohmic range: DC 10 volts,100 volts and 500 voltsTest range:low ohmic range: 1 to 10 kOhmhigh ohmic range: 1 kOhm to 199 GOhmOperation: Battery operatedProbes:2x Model 870 (weight: 2,27 kg / ø 63,5 mm) with conductive rubber (grey) and extension,1x hand-held probe Model 45
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TEST MANAGEMENT JIRA
QARAJ
QARA – Test Management for JIRA (QARAJ) is an add-on that is used with JIRA to enhance its test management capabilities. It can also be used with QARA Enterprise to track projects and bugs on the same platform, without the need to switch to JIRA. The add-on is available for download on the Atlassian Marketplace.
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USB4 Version 2.0 Receiver Compliance Test Software
N5991U42A
N5991U42A is the receiver compliance test automation software, allowing you to test and characterize USB4 Version 2.0 PAM3 designs.
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Flexible Test And Scan Solution For FFC Devices
Ismeca NY32W
32-position turret test and scan platform for semiconductors on film-frame wafer media, providing the highest inspection yield for WLCSP and Bare Dies. Integrating innovative hardware and software technologies such as intelligent features that enable extended autonomous operation and productivity.
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Inspection Systems
EVG's metrology solutions for wafer inspection and measurement are optimized for lithography and all types of bonding applications. Customers can choose between integration of the metrology technology within fully-automated equipment, or stand-alone metrology systems serving multiple process steps. EVG's metrology solutions are optimized to maximize our customers' production yields, featuring:
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DC System Power Supply, 20 V, 38 A, 760 W
N5744A
The single output, 760W N5744A provides universal AC input, GPIB, LAN, USB, LXI compliance, and analog/resistance control of output voltage and current.
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Circuit Breaker Test Equipment
Providing the in-depth analysis to ensure effective maintenance maximum reliability.
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Two-Way Optical Loss Test Set
KI23410OLF-INGAAS-APC
A Two-Way Optical Loss Test set (OLTS) that's perfect for medium to ultra high fiber count loss, length and optical return loss testing applications on single mode fiber with an APC connector at triple 1310 / 1550 / 1625 nm. A pair of these compact instruments set new standards of productivity, accuracy and ease of use. The 650 nm VFL is on a separate port.
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Field Test Interface Kit
2200
TESCO’s new Field Test Interface Kit (Catalog No. 2200) provides metering professionals with exceptional testing flexibility. The Field Test Interface includes a zero insertion force (ZIF) meter socket, voltage and form selection, and connection points to link it with a TESCO Field Test Kit (Catalog No. 621, 630 or GA Series). When combined with a Field Test Kit and powered via inverter (commonly used on service trucks), the Field Test Interface will then power the Field Test Kit to create a sin...show more -
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1040g Steel Impact Ball Drop Impact Test Ball
CX-B104
Shenzhen Chuangxin Instruments Co., Ltd.
1040g Steel impact ball drop impact test ball
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Fanless Embedded System With LGA1151 Intel® Xeon®, 9th/8th Gen Intel® Core™ I7/i5/i3 Or Celeron® Processor, Intel® C246, ECC/Non-ECC And 1 PCIe X4 Expansion Slot
eBOX710-521-FL
*Intel® Xeon®, 9th/8th gen Intel® Core™ i7/i5/i3 or Celeron®processor*2 DDR4 ECC/non-ECC memory supported, up to 64GB*Dual swappable 2.5" SATA HDD drive bays with RAID 0 &1*DVI-I, HDMI, and DisplayPort with triple-view supported*6 GbE LAN, 6 USB 3.2 and 1 PCIe x4 expansion slot*Flexible I/O window supported
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Dual Channel Gigabit Ethernet Test & Simulation Instrument for PCI Express
PCIe-DCE
Avionics Interface Technologies
Dual channel, high precision Ethernet Test Instrument
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Universal II Level System
The Universal II is a two wire level transmitter that eliminates the need for line power in the field and saves costs for additional hardware. It provides reliable level measurements in all kinds of process liquids, slurries, granulars and interfaces.
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"Condulet" Style CP Test Station
T2
Fits 3/4" Riser pipe3+ hole terminal board3 binding postsExternal terminals7 colors from stockUV Stabilized color protectionHigh impact resistanceFire resistantGasket seal to protect inside
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MIL-STD-1553 & ARINC XMC Interface For SBCs, VPX, VME, CPCI/PXI Systems
XMC-MA4
The XMC-MA4’s BC capability includes variable message/label framing/subframing with transmission scheduling provides the most advanced control operations. ARINC TX has complete frequency control per channel. RT and ARINC RX, Monitor, Playback and Signal Generator functions also include industry leading functions to meet the most demanding requirements.
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Complex System Solutions
К2М-100 Series
*Operating Frequency Range: 100 MHz*Measurements per Connection*All S-Parameter Measurement (256 states)*SOLT Calibration*Measurement Profile Save*Full and Cross Measurement Result Analysis
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Test Automation Framework Design Services
This Services utilize uses a systematic, multi-stage approach to creating a framework for your organization.In simple terms, a framework defines the organization’s way of doing things.
